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Scanning Probe Microscopy of Functional Materials pp 181–198Cite as

Toward Nanoscale Chemical Imaging: The Intersection of Scanning Probe Microscopy and Mass Spectrometry

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Abstract

Advances in analytical technology have pushed the limits of our understanding of chemical and physical phenomena as new tools create new opportunities for discovery. The levels of sensitivities and signal-to-noise levels of atmospheric pressure mass spectrometry techniques have increased to the point that the chemical content of nanometer-sized volumes of material can be determined. Advances in scanning probe technology, which have resulted in improved stability and material property determination, make interfacing with mass-spectrometry possible. Innovations in probe technology to couple or focus intense light or heat at the probe tip enable new ways to remove and transfer specific and highly localized material from the sample surface to the mass spectrometer. The marrying of these two previously separate fields of study creates a viable pathway for true nanoscale chemical imaging. This chapter will cover the recent advances in mass spectrometry that can most readily be coupled with ambient scanning probes and discuss the state-of-the-art efforts to combine these techniques.

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Author information

Authors and Affiliations

  1. Department of Physics and Astronomy, University of Tennessee, Knoxville 401 Nielsen Physics Building, 1408 Circle Drive, Knoxville, TN, 37996-1200, USA

    Olga S. Ovchinnikova

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  1. Olga S. Ovchinnikova
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Editors and Affiliations

  1. , NanoTransport Laboratory, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, 37831, Tennessee, USA

    Sergei V. Kalinin

  2. Dept. Materials Science and Engineering, Department of Physics & Astronomy, University of Nebraska - Lincoln, 202 Ferguson Hall 7920, Lincoln, 68588, Nebraska, USA

    Alexei Gruverman

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Ovchinnikova, O.S. (2010). Toward Nanoscale Chemical Imaging: The Intersection of Scanning Probe Microscopy and Mass Spectrometry. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy of Functional Materials. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-7167-8_7

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