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High-Speed Piezo Force Microscopy: Novel Observations of Ferroelectric Domain Poling, Nucleation, and Growth

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Scanning Probe Microscopy of Functional Materials

Abstract

High-speed piezo force microscopy (HSPFM) has been developed to map ferroelectric properties with imaging rates beyond 1frame/s. In addition to efficient measurements of large areas, multiple samples, and various experimental conditions, this capability is particularly advantageous for monitoring ferroelectric domain poling dynamics. As discussed, this includes identifying switching mechanisms, elucidating the influence of structural defects, and especially quantifying and mapping nucleation times and growth rates. Domains written with tip speeds beyond 1cm/s are also presented and analyzed.

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Authors and Affiliations

  1. Materials Science and Engineering Program and Institute of Materials Science, University of Connecticut, Storrs, CT, 06269, USA

    Bryan D. Huey

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  1. Bryan D. Huey
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  2. Ramesh Nath
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Correspondence to Bryan D. Huey .

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Editors and Affiliations

  1. , NanoTransport Laboratory, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, 37831, Tennessee, USA

    Sergei V. Kalinin

  2. Dept. Materials Science and Engineering, Department of Physics & Astronomy, University of Nebraska - Lincoln, 202 Ferguson Hall 7920, Lincoln, 68588, Nebraska, USA

    Alexei Gruverman

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Huey, B.D., Nath, R. (2010). High-Speed Piezo Force Microscopy: Novel Observations of Ferroelectric Domain Poling, Nucleation, and Growth. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy of Functional Materials. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-7167-8_11

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