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Single Event Effects: Mechanisms and Classification

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Book cover Soft Errors in Modern Electronic Systems

Part of the book series: Frontiers in Electronic Testing ((FRET,volume 41))

Abstract

Single Event Effects (SEEs) induced by heavy ions, protons, and neutrons become an increasing limitation of the reliability of electronic components, circuits, and systems, and have stimulated abundant past and undergoing work for improving our understanding and developing mitigation techniques. Therefore, compiling the knowledge cumulated in an abundant literature, and reporting the open issues and ongoing efforts, is a challenging task. Such a tentative should start by discussing the fundamental aspects of SEEs before reviewing the different steps that are necessary for creating comprehensive prediction models and developing efficient mitigation techniques.

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Notes

  1. 1.

    The state where the quantity of a radioactive isotope remains constant because its production rate (due, e.g., to decay of a parent isotope) is equal to its decay rate.

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  1. Saint-Arnoult on Yvelines, France

    Rémi Gaillard (Consultant)

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  1. Rémi Gaillard
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Correspondence to Rémi Gaillard .

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  1. Grenoble INP, CNRS, UJF, TIMA Laboratory, av. Felix Viallet 46, Grenoble CX, 38031, France

    Michael Nicolaidis

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Gaillard, R. (2011). Single Event Effects: Mechanisms and Classification. In: Nicolaidis, M. (eds) Soft Errors in Modern Electronic Systems. Frontiers in Electronic Testing, vol 41. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-6993-4_2

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  • DOI: https://doi.org/10.1007/978-1-4419-6993-4_2

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