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Introduction

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Dependability in Electronic Systems

Abstract

Figure 1.1 shows trends in failure cause with transition of technology. In the industrial history, the major failure modes were permanent fault, malfunction of electronic parts caused by electric and physical stress, and worn-out. As for one of the first computers in the history of electronic numerical integrator and computer (ENIAC), people’s eagerness to attain reasonable availability (see Section 5.2.2 for its definition) at that time is well understood [1]. It is said that a couple of vacuum tubes broke weekly, and the availability was 90% with special careful treatment, derating, and keeping the machine turned on. In addition, it is also said that the longest time (not mean time) between failures was 116 h.

Nobuyasu Kanekawa

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References

  1. Alexander Randall 5th, “A Lost Interview with ENIAC Co-inventor J. Presper Eckert,” Comput. World, 14 February 2006. http://www.computerworld.com/printthis/2006/0,4814,108568,00.html.

  2. G.E. Moore, “Cramming More Components onto Integrated Circuits,” Electron. Mag., Vol. 38, No. 8, pp. 114–117 (1965).

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  3. T.J. O’Gorman, et al., “Field Testing for Cosmic Ray Soft Error in Semiconductor Memories,” IBM J. R & D, Vol. 40, No. 1, pp. 41–50 (1996).

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  4. E. Ibe, “Current and Future Trend on Cosmic-Ray-Neutron Induced Single Event Upset at the Ground Down to 0.1-Micron-Device,” The Svedberg Laboratory Workshop on Applied Physics, Uppsala, May 3, No.1 (2001).

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Correspondence to Nobuyasu Kanekawa .

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Kanekawa, N., Ibe, E.H., Suga, T., Uematsu, Y. (2011). Introduction. In: Dependability in Electronic Systems. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-6715-2_1

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  • DOI: https://doi.org/10.1007/978-1-4419-6715-2_1

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