Abstract
This chapter targets the study of dynamic faults that affect the address decoders of SRAMs, in particular ADOFs (Address Decoder Open Faults) and resistive-ADOFs that are caused by intra-gate pure open and resistive-open defects. Experiments show that resistive-ADOFs, which are a generalization of ADOFs, require more stringent timing constraints for their sensitization. Several algorithmic solutions are effective to test these faults. These so-lutions are mainly based on the ‘Sachdev’s pattern.’ One of these test solutions consists in a compact 2 N March test that can be em-bedded in existing March tests, without modifying their complexity and their capability to cover the former target faults. A meaningful example of a modified test algorithm covering ADOFs is March iC-, which is an improved version of March C-.
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Girard, P., Bosio, A., Dilillo, L., Pravossoudovitch, S., Virazel, A. (2010). Resistive-Open Defects in Address Decoders. In: Advanced Test Methods for SRAMs. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-0938-1_4
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DOI: https://doi.org/10.1007/978-1-4419-0938-1_4
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Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-0937-4
Online ISBN: 978-1-4419-0938-1
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