Basics on SRAM Testing

Abstract

This chapter presents the context of this book. After an introduction offering an overview of the different types of memories, it focuses on SRAMs. The main aspects of SRAM testing are then tackled, and the two main classes of faults affecting SRAMs, i.e., static and dynamic faults, are presented. After that, the standard notation of a March test is described. This category of memory test is commonly used due to the low complexity of the algorithms. Moreover, their flexibility allows reaching a high coverage level for many fault models. In the last part of this chapter, the main methods targeting automatic generation of March tests and memory fault simulation are discussed.