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Conclusions and Future Directions

  • Rajesh Garg
  • Sunil P. Khatri
Chapter

Abstract

This chapter summarizes the work presented in this monograph. It provide a brief summary of all the analysis and design approaches presented to facilitate the implementation of radiation and process variation tolerant VLSI circuits. This chapter also presents some future directions for research, and a summary of the broader impact of this work.

Keywords

Combinational Circuit VLSI Circuit SRAM Cell Dynamic Voltage Scaling VLSI System 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag US 2010

Authors and Affiliations

  1. 1.HillsboroUSA
  2. 2.Department of Electrical and Computer EngineeringTexas A & M UniversityCollege StationUSA

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