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Development of Multilayer Optics in EUV, Soft X-Ray and X-Ray Range at IPOE

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Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 130))

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Abstract

Multilayer coatings are key optical components in the EUV, soft X-ray and X-ray range. At Institute of Precision Optical Engineering (IPOE), the development of multilayer optics has been impelled for their wide applications in X-ray laser, plasma diagnostics, astronomical observation and synchrotron radiation. The paper presents our recent results of periodic multilayers of Mo/Si, Cr/C, Cr/Sc, La/B4C, Mo/B4C, Si/C, Si/SiC, Mg/SiC Mo/Y and Ru/Y. To improve the reflectivity of Ru/Y multilayer mirrors, Mo layers were inserted between Ru and Y layer. The Mo barrier layers suppress intermixing between Ru and Y, thereby increasing the reflectivity of Ru/Y multilayer. We also discuss the application of Mo/Si, Mo/Y, Mo/B4C, La/B4C non-periodic multilayers in EUV broadband polarization measurement.

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Wang, Z. et al. (2009). Development of Multilayer Optics in EUV, Soft X-Ray and X-Ray Range at IPOE. In: Lewis, C.L.S., Riley, D. (eds) X-Ray Lasers 2008. Springer Proceedings in Physics, vol 130. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-9924-3_45

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