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Piezoresponse Force Micropscopy

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Characterisation of Ferroelectric Bulk Materials and Thin Films

Part of the book series: Springer Series in Measurement Science and Technology ((SSMST,volume 2))

Abstract

Scanning probe microscopy (SPM) is a very versatile technique allowing for a large range of sample properties to be measured and manipulated with nanometre spatial resolution.

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Authors and Affiliations

  1. National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK

    Serban Lepadatu & Markys G. Cain

Authors
  1. Serban Lepadatu
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  2. Markys G. Cain
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Correspondence to Serban Lepadatu .

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Editors and Affiliations

  1. National Physical Laboratory, Teddington, Middlesex, United Kingdom

    Markys G. Cain

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Lepadatu, S., Cain, M.G. (2014). Piezoresponse Force Micropscopy. In: Cain, M. (eds) Characterisation of Ferroelectric Bulk Materials and Thin Films. Springer Series in Measurement Science and Technology, vol 2. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-9311-1_8

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