Abstract
To a large extent, PSD analyses are executed off-line in an analytical laboratory. The advantage of the laboratory is that a variety of techniques, trained analysts and standard operating procedures (SOP’s) are available. Moreover, both instruments and procedures can be checked at regular time intervals, so that good quality assurance is possible. On the other hand, instrumentation for the production line and near-proximity to the line has become available. Such instruments allow frequent analyses without any dead time. Thus, they are very well capable of monitoring and controlling production processes in order to deliver targeted products within narrow limits. This chapter discusses the instrumental options for PSD analysis together with their advantages and disadvantages. Also, quality requirements for process monitoring and control together with available techniques are described. It can be expected that more and more on- and in-line PSD instruments will be used in the future.
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Bibliography
ISO 9276-4 (2001), Characterization of a Classification Process.
M.S. Beck, B.S. Hoyle, M.A. Morris, R.C. Waterfall, R.A. Williams, Process Tomography; Implementation for Industrial Processes, 1995 UMIST, University of Manchester Institute of Science and Technology.
M.A.van Drunen, Measurement and Modeling of Cluster Formation, 1996, PhD Thesis Delft University of Technology.
R. Eek, Control and Dynamic Modeling of Industrial Suspension Crystallizers, 1995, PhD Thesis Delft University of Technology.
E. Gommeren, Study of a Closed Circuit Jet Mill Plant Using On-Line Particle Size Measurement, 1997, PhD Thesis Delft University of Technology; Delft University Press.
C.J. Grootveld, Measuring and Modelling of Concentrated Settling Suspensions Using Electrical Impedance Tomography, 1996, PhD Thesis Delft University of Technology.
C.M.G. Heffels, On-Line Particle Size and Shape Characterization by Narrow-Angle Light Scattering, 1995, PhD Thesis Delft University of Technology.
W. C. Hinds, Aerosol Technology, 1999 Wiley & Sons.
J. Jager, H.J.M. Kramer, B. Scarlett, E.J. de Jong, S. de Wolf, AIChE J 37 (1991) 182–192.
Z. Ma, H. Van Der Veen, H.G. Merkus, B. Scarlett, Part. Part. Syst. Charact. 18 (2001) 99–106.
L. Morawska, T. Salthammer (eds.), Indoor Environment, 2003 Wiley-VCH GmbH.
A. M. Neumann, Characterizing Industrial Crystallizers of Different Scale and Type, 2001, PhD Thesis Delft University of Technology.
A. Romanonski, K. Grudzien, R.A. Williams, Part. Part. Syst. Charact. 23 (2006) 297–305.
H.I. Schlaberg, J.H. Baas, M. Wang, J.L. Best, R.A. Williams, J. Peakall, Part. Part. Syst. Charact. 23 (2006) 313–320.
Ullmanns Encyclopaedie der Technischen Chemie, Vol. 2, 35–42, 1972 Verlag Chemie GmbH.
J.H. Vincent, Aerosol Sampling; Science and Practice, 1989 Wiley & Sons.
K. Willeke and P. A. Baron (eds.), Aerosol Measurements, 1993 Van Nostrand Reinhold.
A.W. Willemse, Optical measuring Techniques for Particulate Systems at the Fringes of Concentration, 1998, PhD Thesis Delft University of Technology.
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Merkus, H.G. (2009). In- and On-Line Measurement. In: Particle Size Measurements. Particle Technology Series, vol 17. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-9016-5_14
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DOI: https://doi.org/10.1007/978-1-4020-9016-5_14
Publisher Name: Springer, Dordrecht
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