In- and On-Line Measurement

  • Henk G. Merkus
Part of the Particle Technology Series book series (POTS, volume 17)


To a large extent, PSD analyses are executed off-line in an analytical laboratory. The advantage of the laboratory is that a variety of techniques, trained analysts and standard operating procedures (SOP’s) are available. Moreover, both instruments and procedures can be checked at regular time intervals, so that good quality assurance is possible. On the other hand, instrumentation for the production line and near-proximity to the line has become available. Such instruments allow frequent analyses without any dead time. Thus, they are very well capable of monitoring and controlling production processes in order to deliver targeted products within narrow limits. This chapter discusses the instrumental options for PSD analysis together with their advantages and disadvantages. Also, quality requirements for process monitoring and control together with available techniques are described. It can be expected that more and more on- and in-line PSD instruments will be used in the future.


Dynamic Light Scattering Draft Tube Focus Beam Reflectance Measurement Control Production Process Focus Beam Reflectance Measurement 
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  1. 1.
    ISO 9276-4 (2001), Characterization of a Classification Process.Google Scholar
  2. 2.
    M.S. Beck, B.S. Hoyle, M.A. Morris, R.C. Waterfall, R.A. Williams, Process Tomography; Implementation for Industrial Processes, 1995 UMIST, University of Manchester Institute of Science and Technology.Google Scholar
  3. 3.
    M.A.van Drunen, Measurement and Modeling of Cluster Formation, 1996, PhD Thesis Delft University of Technology.Google Scholar
  4. 4.
    R. Eek, Control and Dynamic Modeling of Industrial Suspension Crystallizers, 1995, PhD Thesis Delft University of Technology.Google Scholar
  5. 5.
    E. Gommeren, Study of a Closed Circuit Jet Mill Plant Using On-Line Particle Size Measurement, 1997, PhD Thesis Delft University of Technology; Delft University Press.Google Scholar
  6. 6.
    C.J. Grootveld, Measuring and Modelling of Concentrated Settling Suspensions Using Electrical Impedance Tomography, 1996, PhD Thesis Delft University of Technology.Google Scholar
  7. 7.
    C.M.G. Heffels, On-Line Particle Size and Shape Characterization by Narrow-Angle Light Scattering, 1995, PhD Thesis Delft University of Technology.Google Scholar
  8. 8.
    W. C. Hinds, Aerosol Technology, 1999 Wiley & Sons.Google Scholar
  9. 9.
    J. Jager, H.J.M. Kramer, B. Scarlett, E.J. de Jong, S. de Wolf, AIChE J 37 (1991) 182–192.Google Scholar
  10. 10.
    Z. Ma, H. Van Der Veen, H.G. Merkus, B. Scarlett, Part. Part. Syst. Charact. 18 (2001) 99–106.Google Scholar
  11. 11.
    L. Morawska, T. Salthammer (eds.), Indoor Environment, 2003 Wiley-VCH GmbH.Google Scholar
  12. 12.
    A. M. Neumann, Characterizing Industrial Crystallizers of Different Scale and Type, 2001, PhD Thesis Delft University of Technology.Google Scholar
  13. 13.
    A. Romanonski, K. Grudzien, R.A. Williams, Part. Part. Syst. Charact. 23 (2006) 297–305.Google Scholar
  14. 14.
    H.I. Schlaberg, J.H. Baas, M. Wang, J.L. Best, R.A. Williams, J. Peakall, Part. Part. Syst. Charact. 23 (2006) 313–320.Google Scholar
  15. 15.
    Ullmanns Encyclopaedie der Technischen Chemie, Vol. 2, 35–42, 1972 Verlag Chemie GmbH.Google Scholar
  16. 16.
    J.H. Vincent, Aerosol Sampling; Science and Practice, 1989 Wiley & Sons.Google Scholar
  17. 17.
    K. Willeke and P. A. Baron (eds.), Aerosol Measurements, 1993 Van Nostrand Reinhold.Google Scholar
  18. 18.
    A.W. Willemse, Optical measuring Techniques for Particulate Systems at the Fringes of Concentration, 1998, PhD Thesis Delft University of Technology.Google Scholar

Copyright information

© Springer Science+Business Media B.V. 2009

Authors and Affiliations

  • Henk G. Merkus
    • 1
  1. 1.Delft University of TechnologyCZ PijnackerThe Netherlands

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