Quantitative Material Characterization and Imaging at Nanoscale Using a New AFM Probe

  • F.L. Degertekin
  • M. Balantekin
  • A.G. Onaran
Conference paper
Part of the Acoustical Imaging book series (ACIM, volume 29)

Abstract

The structure of an Atomic force microscope (AFM) probe that integrates fast electrostatic actuation and highly sensitive optical interferometric detection of tip motion is described. The use of this so-called FIRAT probe for quantitative material characterization with high spatial resolution is demonstrated through contact and adhesion modeling. Time resolved interaction forces between the AFM tip and the sample surface is used to map material properties of several samples including silicon, polymer and carbon nanotubes. Non-resonant tapping mode operation of the FIRAT probe has also been demonstrated for use with existing commercial AFM systems.

Key words

Atomic force microscopy Material characterization 

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Copyright information

© Springer Science+Business Media B.V. 2008

Authors and Affiliations

  • F.L. Degertekin
    • 1
  • M. Balantekin
    • 1
  • A.G. Onaran
    • 1
  1. 1.G.W. Woodruff School of Mechanical EngineeringGeorgia Institute of TechnologyAtlantaUSA

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