Advertisement

Electron Tomography of Mesoporous Silica for Gas Sensor Applications

  • E Rossinyol
  • F Bohils
  • F Cardoso
  • H Montón
  • M Roldán
  • M Rosado
  • A Sánchez-Chardi
  • O Castell
  • M D Baró
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 120)

Summary

The complex 3-D structures of some materials must be visualized and analyzed for structural characterization, often as part of quality control of a synthetic process. In this work we applied electron tomography for the 3-D reconstruction of a mesoporous SBA-15 silica structure doped with platinum as a catalytic additive. We used a 200kV JEOL 2011 transmission electron microscope with a ±60 degrees tilting holder. Digital Micrograph software was used for automatic acquisitions and Imod software for the digital reconstruction. Moreover, we use a combination of microscopy techniques: scanning electron microscopy and confocal scanner laser microscopy in reflection mode.

Keywords

Mesoporous Silica Electron Tomography Silica Template Automatic Acquisition Digital Reconstruction 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Joo S H, Choi S J, Oh I, Kwak J, Liu Z, Terasaki O and Ryoo R, 2001 Nature 412, 169PubMedCrossRefADSGoogle Scholar
  2. 2.
    Trong On D, Desplantier-Giscard D, Danumah C and Kaliaguine S 2001 Appl. Catal. A 222, 299CrossRefGoogle Scholar
  3. 3.
    Kageyama K, Tamazawa J and Aida T 1999 Science, 285, 2113PubMedCrossRefGoogle Scholar
  4. 4.
    Koster A J, Ziese U, Verkleij A J, Janssen A H and de Jong K P 2000 J. Phys. Chem. B, 104, 9368CrossRefGoogle Scholar
  5. 5.
    Zhou W, Thomas J M, Shephard D S, Johnson B F G, Ozkaya D, Maschmeyer T, Bell R G and Ge Q 1998 Science 280, 705PubMedCrossRefADSGoogle Scholar
  6. 6.
    Cai W, Zhang Y, Jia J and Zhang L 1998 Appl. Phys. Lett. 73, 2709CrossRefADSGoogle Scholar
  7. 7.
    Ryan J V, Berry A D, Anderson M L, Long J W, Stroud R M, Cepak V M, Browning V M, Rolison D R and Merzbacher C I 2000 Nature 406, 169PubMedCrossRefADSGoogle Scholar
  8. 8.
    Cabot A, Arbiol J, Cornet A, Morante J R, Chen F and Liu M 2003 Thin Solid Films 436, 64CrossRefADSGoogle Scholar
  9. 9.
    Cabot A, Arbiol J, Rossinyol E, Morante J R, Chen F and Liu M 2004 Electrochem. Solid-State Lett. 7, G93CrossRefGoogle Scholar
  10. 10.
    Kremer J.R., Mastronarde D N and McIntosh J R 1996 J. Struct. Biol. 116, 71PubMedCrossRefGoogle Scholar
  11. 11.
    Zhu K, He H, Xie S, Zhang X, Zhou W, Jin S and Yue B 2003 Chem. Phys. Lett. 377, 317CrossRefADSGoogle Scholar
  12. 12.
    Zhao D, Feng J, Huo Q, Melosh N, Fredrickson G H, Chmelka B F and Stucky G D 1998 Science 279, 548PubMedCrossRefADSGoogle Scholar

Copyright information

© Springer Science+Business Media B.V. 2008

Authors and Affiliations

  • E Rossinyol
    • 1
  • F Bohils
    • 1
  • F Cardoso
    • 1
  • H Montón
    • 1
  • M Roldán
    • 1
  • M Rosado
    • 1
  • A Sánchez-Chardi
    • 1
  • O Castell
    • 1
  • M D Baró
    • 1
  1. 1.Edifici C, Facultat de cliènciesMicroscopy Service, Universitat Autònoma de BarcelonaBellaterraSpain

Personalised recommendations