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The Test and Verification Influential Papers in the 10 Years of DATE

  • T. W. Williams
  • R. Kapur

Abstract

The history of test is looked at for IC Test to put in context the papers that are being highlighted at DATE. This paper focuses on the path that led to the adoption of structural test. ATE related historical aspects are not mentioned.

Keywords

Transition Fault Fault Coverage Soft Error Delay Defect Automatic Test Pattern Generation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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Copyright information

© Springer 2008

Authors and Affiliations

  • T. W. Williams
    • 1
  • R. Kapur
    • 1
  1. 1.Synopsys Inc.USA

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