VUV and Soft X-Ray Spectroscopy Using a Toroidal Grating Spectrograph

  • E. Jourdain
  • W. Biel
  • D. Lepère
  • J. Serre
  • A. Liard
  • A. Greiche
  • R. Burhenn
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 115)

Summary

Optical spectroscopy is a key tool to monitor and therefore analyse properties of laser emission light sources such as X-Ray lasers. A spectrograph instrument that produces flat field detection over relative wide spectral range enables quick and reliable analysis of X-Ray laser emitted spectra thanks to the easy coupling with CCD camera or MCP detector. We present a compact spectrograph design based on aberration corrected toroidal diffraction gratings dedicated to optical spectroscopy in the VUV and Soft X-Ray wavelength range. The toroidal aberration corrected grating acts as a diffractive and focusing element allowing compact design with only one optical element. Such compact design provides high throughput, good wavelength purity as well as great stability and reproducibility. After a review of the flat field toroidal grating parameters design, we present the performances of several toroidal gratings optimised for operation in the 2.5 to 170 nm wavelength range. Measured spectra of pinch discharge sources are presented to illustrate the performance of toroidal spectrograph instruments

Keywords

Eten Tral Flange Hexos 

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References

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Copyright information

© Springer 2007

Authors and Affiliations

  • E. Jourdain
    • 1
  • W. Biel
    • 2
  • D. Lepère
    • 1
  • J. Serre
    • 1
  • A. Liard
    • 1
  • A. Greiche
    • 2
  • R. Burhenn
    • 3
  1. 1.HORIBA Jobin Yvon SAS91165 LongjumeauFrance
  2. 2.Institut für Plasmaphysik,Forschungszentrum Jülich GmbhD-52425 JülichGermany
  3. 3.Max-Planck-Institut für PlasmaphysikD-17491 Greifswald

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