Abstract
Radiation effects translated into Single Event Transients (SETs) and Single Event Upsets (SEUs) are dealt with, in this chapter, in the realm of analog and mixed-signal circuits. First of all, we revisit concepts and methods of the analog testing field looking for techniques that may help mitigating, at the system level, SETs and SEUs in these circuits. Then, two mixed-signal case studies are presented. The first case study investigates the effects of SEUs in a new kind of analog circuit: the Field Programmable Analog Arrays (FPAAs). Some FPAA devices are based on SRAM memory cells to implement the user programmability. For this reason the effect of radiation in such circuits can be as dangerous as it is for FPGAs. BIT-flip experiments are performed in a commercial FPAA, and the obtained results show that a single BIT inversion can result in a very different configuration of that previously programmed into the device. The second case study is focused on ΣΔ A/D Converters. A MatLab-based model of such converter is built and a series of fault injection experiments is performed. The results show that the ΣΔ converter can be used in radiation environment, if its digital part is protected. Such protection can be achieved by adopting some design directives. This chapter ends by proposing the use of online analog test methods, in particular self-checking circuits, that can be applied to detect SET and SEU faults during the circuit operation, therefore allowing the design of self-recovering systems.
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Lubaszewski, M., Balen, T., Schuler, E., Carro, L., Huertas, J.L. (2007). Effects of Radiation on Analog and Mixed-Signal Circuits. In: VELAZCO, R., FOUILLAT, P., REIS, R. (eds) Radiation Effects on Embedded Systems. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-5646-8_5
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DOI: https://doi.org/10.1007/978-1-4020-5646-8_5
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