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Test Facilities for SEE and Dose Testing

  • Chapter
Radiation Effects on Embedded Systems

Abstract

This chapter addresses the field of testing and characterizing the response of electronic devices to radiation exposure. Firstly, a brief overview of the critical parameters that influences the devices degradation or malfunction will be given in order to show how the standards and guidelines deal with them. Then, the most widely used facilities will be described (particle accelerators, radioactive source…) and their domain of application defined.

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Author information

Authors and Affiliations

  1. Office National d'Etudes et de Recherches en Aérospatiale (ONERA), Space Environment Department (DESP), 2 avenue E. Belin, Toulouse cedex, F-31055, France

    S. Duzellier

  2. Centre de Recherches du cyclotron, Université Catholique de Louvain-La-Neuve, 2 chemin du cyclotron, Louvain-La-Neuve, B-1348, Belgique

    G. Berger

Authors
  1. S. Duzellier
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  2. G. Berger
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Editor information

Editors and Affiliations

  1. TIMA Laboratory, Grenoble, France

    RAOUL VELAZCO

  2. Université Bordeaux 1, France

    PASCAL FOUILLAT

  3. Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil

    RICARDO REIS

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© 2007 Springer

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Duzellier, S., Berger, G. (2007). Test Facilities for SEE and Dose Testing. In: VELAZCO, R., FOUILLAT, P., REIS, R. (eds) Radiation Effects on Embedded Systems. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-5646-8_10

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  • DOI: https://doi.org/10.1007/978-1-4020-5646-8_10

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-1-4020-5645-1

  • Online ISBN: 978-1-4020-5646-8

  • eBook Packages: EngineeringEngineering (R0)

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