Abstract
We report the discovery of a novel pseudoelastic behavior in single-crystalline Cu nanowires through atomistic simulations. Under tensile loading and unloading, the nanowires are capable of recovering elongations up to 51%, well beyond the typical recoverable strains of 5–8% for most bulk shape memory alloys (SMAs). This phenomenon is associated with a reversible crystallographic lattice reorientation driven by the high surface-stress-induced internal stresses due to high surface-to-volume ratios at the nanoscale. The temperature-dependence of this behavior leads to a shape memory effect (SME). This behavior is well-defined for wires between 1.76 and 3.39 nm in size over the temperature range of 100–900 K.
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Liang, W., Zhou, M. (2007). Shape Memory Effect and Pseudoelasticity in Cu Nanowires. In: Bai, Y.L., Zheng, Q.S., Wei, Y.G. (eds) IUTAM Symposium on Mechanical Behavior and Micro-Mechanics of Nanostructured Materials. Solid Mechanics and its Applications, vol 144. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-5624-6_13
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DOI: https://doi.org/10.1007/978-1-4020-5624-6_13
Publisher Name: Springer, Dordrecht
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