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Software-Based Self-Testing of Embedded Processors

  • Nektarios Kranitis
  • Antonis Paschalis
  • Dimitris Gizopoulos
  • George Xenoulis

No silicon integrated circuit (IC) manufacturing process is perfect. Therefore, IC testing is used to screen imperfect devices before shipping them to customers. Chips containing manufacturing defects are potentially malfunctioning chips that may cause system crashes and lead to financial deficit, environmental disaster, and/or jeopardize human life. Moreover, if manufacturing defects are not detected early, the cost of repair is increased by an order of magnitude at each step after the chip fabrication line. It comes naturally that chip testing is an important factor of the business in computer and communications industries, since customers demand reliable products at a reasonable cost and manufacturers, in order to stay competitive in business, must find the means to provide the best products at the lowest cost.

Keywords

Fault Coverage Instruction Sequence Embed Processor Bounded Model Checker Automatic Test Equipment 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer 2007

Authors and Affiliations

  • Nektarios Kranitis
    • 1
  • Antonis Paschalis
    • 1
  • Dimitris Gizopoulos
    • 2
  • George Xenoulis
    • 2
  1. 1.Department of Informatics and TelecommunicationsNational and Kapodistrian University of AthensIlissiaGreece
  2. 2.Department of InformaticsUniversity of PiraeusGreece

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