Abstract
The basic electronic structure properties of materials are all related to some characteristic lengths whose scales depend on which property is considered. Examples are the Fermi wavelength or the electron mean free path for conductivity, the Debye wavelength for phonons, the dipolar interaction distance for electromagnetic interactions, the pair correlation length for superconductivity, etc., all of which vary typically from ~ 0.1 to several tens of nanometers. A fundamental question in nanoscience is what happens when the physical size of the sample shrinks down to the characteristic length scale of one or another of its basic physical properties? The sample’s electrical, optical, magnetic or mechanical properties will then be radically affected by its size and shape, by the symmetry of its environment, and by its coupling (chemical bonds, radiation, etc.) to the latter. Their hybrid “betwixt atom and bulk” matter nature often directly reflects their electrical, optical or mechanical properties. As we know, the quantum properties are extremely sensitive to the boundary conditions of wave functions in the nano-objects. Hence, not only do such studies require small samples, but in order to be meaningful, they require samples such as nanoclusters or ultrathin films and multilayers with well-controlled shapes, sizes, and interfaces.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
REFERENCES
Nanoelectronics and Information Technology, ed. R. W ä ser, Wiley-VCH (2003)
N. Mathur and P. Littlewood, Nature Materials 3 (2005) 207
J. Gierak et al., Microelectron. Eng. 78–79 (2005) 266 and 73–74 (2004) 610
J. Lohau et al., Appl. Phys. Lett. 78 (2001) 990; see also G. Xiong et al., Appl. Phys. Lett. 79 (2001) 3461
“Semiconductor Quantum Dots,” MRS Bull. 23(2), Feb. 1998
B. Prével et al., Appl. Surf. Sci. 226 (2004) 173; M.D. McMahon et al., Phys. Rev. 73 (2006) 041401(R)
S. Haussman et al., Jap. J. Appl. Phys. (Part 1) 38 (1999) 7148
T. Müller et al., Mat. Sci. Eng. C19 (2002) 209
D. Weller and A. Moser, IEEE Trans. Magn. 35 (1999) 4423
M.G. LeBoité et al., Mater. Lett. 6 (1988) 1089; A. Traverse et al., Europhys. Lett. 8 (1989) 633
C. Chappert et al., Science 280 (1998) 1919
J. Ferré et al., J. Phys. D36 (2003) 1
S. Chou et al., Science 272 (1996) 85
T. Devolder et al., Appl. Phys. Lett. 74 (1999) 3383; T. Devolder et al., J. Magn. Mag. Mat. 249 (2002) 452
S.Sun et al., Science 287 (2000) 1989; S. Sun, Adv. Mat. 18 (2006) 396
H. Bernas et al., Phys. Rev. Lett. 91 (2003) 077203
J. Noguès and I. K. Schuller, J. Magn. Mag. Mat. 192 (1999) 203
Miltenyi et al., Phys. Rev. Lett. 84 (2000) 4224; Misra et al., J. Appl. Phys. 93 (2003) 8593
Mougin et al., Phys. Rev. B63 (2001) 060409
Poppe et al., Europhys. Lett. 66 (2004) 430; J.V. Kim and R.L. Stamps, Appl. Phys. Lett. 79 (2001) 2785
G. Mie, Ann. Physik, 25 (1908) 377
M.Bawendi et al., Ann. Rev. Phys. Chem. 41 (1990) 477
S.V. Gaponenko, Optical Properties of Semiconductor Nanocrystals (Cambridge Univ. Press. Cambridge, 1998)
D.E. Porter and K.E. Easterling, Phase Transformations in Metals and Alloys (Van Nostrand Reinhold, Wokingham, England, 1981); K. Binder and D. Stauffer, Adv. Phys. 25 (1976) 343
I.M. Lifshitz and Slyozov, J. Phys. Chem. Solids 19 (1961) 35 and C. Wagner, Z. Elektrochem. 65 (1961) 581. See also [24].
A.F. Hebard et al., J. Phys. D37 (2004) 511
S. Coffa and A. Polman, ed., Materials and Devices for Si-based Optoelectronics, Vol. 468, Materials Research Soc., Warrendale, Pa., (1998)
E. Boer, Ph.D. thesis, California Institute of Technology, Pasenda, California (2001)
S. Tiwari et al., Appl. Phys. Lett. 68 (1996) 1377
K.H. Heinig et al., Appl. Phys. A77 (2003) 17
S. Roorda et al., Adv. Mat. 16, (2004) 235
J. Penninkhof et al., Appl. Phys. Lett 83 (2003) 4137
A. Bouhelier et al., Phys. Rev. Lett 95 (2006) 267405
M. Toulemonde et al., Nucl. Inst. Meth. Phys. Res. B216 (2004) 1
A. Meldrum et al., J. Mater. Res. 14 (1999) 4489
J. Philibert, Atom Movements: Diffusion and Mass Transport in Solids, Ed. Physique, Les Ulis (1991)
K.H. Heinig et al., Appl. Phys. 77 (2003) 17; M. Strobel, Ph.D. Thesis, Forschungzentrum Rossendorf, Germany (1999)
M. Strobel et al., Nucl. Instr. Meth. in Phys. Res. B147 (1999) 343
H. Trinkaus and S. Mantl, Nucl. Inst. Meth. Phys. Res. B 80/81 (1993) 862; V.A. Borodin et al., Phys. Rev. B56 (1997) 5332
R. Espiau de Lamaestre and H. Bernas, Phys. Rev. B73 (2006) 125317
P. Mazzoldi et al., Nucl. Instr. Meth. Phys. Res. 91 (1994) 478 and reference therein
see review by R. A. Weeks, in Optical and Magnetic Properties of Ion Implanted Glasses, Materials Science and Technology Vol. 9, ed. J. Zarzycki, (VCH, Weinheim, 1991) 331
A. Perez et al., J. Mater. Res. 2 (1987) 910
H. Hosono, J. Non-Cryst. Solids 187 (1995) 457
A. Miotello et al., Phys. Rev. B63, (2001) 075409
P. Mazzoldi et al., Nucl. Instr. Meth. Phys. Res. B80/81 (1993) 1192
R. Espiau de Lamaestre et al., Nucl. Instr. Meth. Phys. Res. 242 (2006) 214; R. Espiau de Lamaestre et al., J. Phys. Chem. B109 (2005) 19148; R. Espiau de Lamaestre et al., J. Non-Cryst. Solids 351 (2005) 3031
R. Espiau de Lamaestre and H. Bernas, J. Appl. Phys. 98 (2005) 104310
E. Valentin et al., Phys. Rev. Lett. 86 (2001) 99
Noriaki Itoh and Marshall Stoneham, Materials Modification by Electronic Excitation (Cambridge University Press, Cambridge, 2000)
J. Belloni et al., Nature 402 (1999) 865 and refs. therein
R. Espiau de Lamaestre, Ph.D. Thesis, University of Paris (2005) 11
J. Belloni and M. Mostafavi, Metal Clusters in Chemistry 2 (1999) 1213
A. Barkatt et al., J. Phys. Chem. 76 (1972) 203
R.W. Gurney and N.F. Mott, Proc. Roy. Soc. A164 (1938) 151
A. Paul, Chemistry of Glasses (Chapman & Hall, New York, 1982); H.D. Schreiber et al., Glastechn. Ber. 60 (1987) 389
D. Manikandan et al., Nucl. Instr. Phys. Res. B198 (2002) 73
G. Mattei et al., Phys. Rev. Lett. 90 (2003) 085502
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2007 Springer
About this paper
Cite this paper
Bernas, H., de Lamaestre, R.E. (2007). ION BEAM SYNTHESIS AND TAILORING OF NANOSTRUCTURES. In: Sickafus, K.E., Kotomin, E.A., Uberuaga, B.P. (eds) Radiation Effects in Solids. NATO Science Series, vol 235. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-5295-8_16
Download citation
DOI: https://doi.org/10.1007/978-1-4020-5295-8_16
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-5293-4
Online ISBN: 978-1-4020-5295-8
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)