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Yield Prediction

  • Charles C. Chiang
  • Jamil Kawa
Part of the Series on Integrated Circuits and Systems book series (ICIR)

Keywords

Spatial Correlation Nominal Thickness Yield Prediction Fabrication Facility Yield Score 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer 2007

Authors and Affiliations

  • Charles C. Chiang
    • 1
  • Jamil Kawa
    • 2
  1. 1.Synopsys Inc.Mountain ViewUSA
  2. 2.Synopsys Inc.Mountain ViewUSA

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