Abstract
The problem of testing complex SoC architectures has attracted researchers’ interest the recent years because it is a problem of increasing difficulty and importance for the electronic circuits development community.
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© 2004 Springer Science+Business Media New York
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Gizopoulos, D., Paschalis, A., Zorian, Y. (2004). Testing of Processor-Based SoC. In: Embedded Processor-Based Self-Test. Frontiers in Electronic Testing, vol 28. Springer, Boston, MA. https://doi.org/10.1007/978-1-4020-2801-4_3
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DOI: https://doi.org/10.1007/978-1-4020-2801-4_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-5252-3
Online ISBN: 978-1-4020-2801-4
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