Skip to main content

Unconventional and New Techniques

  • Chapter
Microscopy of Materials
  • 52 Accesses

Abstract

This chapter describes fairly briefly a number of imaging techniques that are not widely used at the time of writing, either because they are rather specialised in their application or because they are relatively new and are not yet established. Since all of these techniques use electrons to form the image, in many cases the equipment is basically similar in design to microscopes described in earlier chapters. An instrument has been included in this chapter if it satisfies the criterion of producing contrast in a partly or wholly new way. For example, high-voltage microscopes are in a sense unconventional, in that their cost makes them relatively rare. Also, they tend to be used for studies in which their higher electron energy is either an advantage (for example, studying thicker materials to see the three-dimensional arrangement of the sub-structure) or a necessity (studying dynamical diffraction effects or producing in situ electron radiation damage). However, they are not considered in this chapter since there is no new principle or technique involved in producing contrast, although in practice the image contrast may appear to be different as a consequence of several strong reflections occurring simultaneously. On the other hand, the mirror electron microscope is included, since it produces contrast in ways not possible with other instruments.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  • Amelinckx, S., Gevers, R., Remaut, G., and van Landuyt, J., (eds) (1970), Modern Diffraction and Imaging Techniques in Material Science, North-Holland, Amsterdam

    Google Scholar 

  • Barnett, M. E. and Nixon, W., (1967), J. scient. Instrum., 44, 893

    Article  Google Scholar 

  • Bok, A., (1970), Modern Diffraction and Imaging Techniques in Material Science, (eds Amelinckx et al.), North-Holland, Amsterdam, 655

    Google Scholar 

  • Born, M. and Wolf, E., (1965), Principles of Optics ( 3rd edn ), Pergamon, Oxford, 381

    Google Scholar 

  • Castaing, R., (1971), Electron Microscopy in Material Science (ed. U. Valdrè), Academic Press, New York, 102

    Google Scholar 

  • Castaing, R., and Henry, L., (1962), C.r. hebd. Séanc. Acad. Sci., Paris, 255, 76

    Google Scholar 

  • Crewe, A., (1970), Q. Rev. Biophys., 3, 137

    Article  Google Scholar 

  • Cundy, S. L., Metherall, A. J. F., and Whelan, M. J., (1966), J. scient. Instrum., 43, 712

    Article  Google Scholar 

  • Curtis, G. H. and Silcox, J., (1971), Rev. scient. Instrum., 42, 630

    Article  Google Scholar 

  • English, T. H., Lea, C. and Lilburne, M. T., (1973), Scanning Electron Microscopy, Systems and Applications, Institute of Physics, Bristol

    Google Scholar 

  • Gadzuk, J. W., and Plummer, E. W., (1973), Rev. mod. Phys., 45, 487

    Article  Google Scholar 

  • Gomer, R., (1961), Field Emission and Field Ionisation Harvard University Press

    Google Scholar 

  • Good, R. H. and Müller, E. W., (1956), Handb. Phys., 21, 176

    Google Scholar 

  • Graber, R., Gribi, M. and Wegmann, L., (1968), Proceedings of the 4th European Regional Conference on Electron Microscopy; Tipografia Poliglotta Vaticana, Rome, 111

    Google Scholar 

  • Kinsman, K. R. and Aaronson, H. I., (1972), Electron Microscopy and Structure of Materials, (ed. G. Thomas ), University of California Press, 259

    Google Scholar 

  • Melmed, A. J., (1965), J. appl. Phys., 36, 3585

    Article  Google Scholar 

  • Melmed, A. J., (1967), J. appl. Phys., 38, 1885

    Article  Google Scholar 

  • Müller, E. W., (1949), Z. Phys., 126, 642

    Article  Google Scholar 

  • Müller, E. W., (1970), Modern Diffraction and Imaging Techniques in Material Science, (eds Amelinckx et al.), North-Holland, Amsterdam, 683

    Google Scholar 

  • Pogany, A. P. and Turner, P. S., (1968), Acta crystallogr., A24, 103

    Article  Google Scholar 

  • Silcox, J., and Vincent, R., (1972), Electron Microscopy and Structure of Materials, (ed. G. Thomas ), University of California Press, 259

    Google Scholar 

  • Swanson, L. W., and Bell, A. E., (1973), Adv. Electronics Electron Phys., 32, 193

    Article  Google Scholar 

  • Valdrè, U., and Zichichi, A., (eds) (1971), Electron Microscopy in Material Science, Academic Press, New York

    Google Scholar 

  • Wegmann, L., (1972a), Electron Microscopy and Structure of Materials (ed. G. Thomas ), University of California Press, 246;

    Google Scholar 

  • Wegmann, L., (1972b), J. Microscopy, 96, 1

    Article  Google Scholar 

  • Zaminer, Ch., (1968), Proceedings of the European Regional Conference on Electron Microscopy, Tipografia Poliglotta Vaticana, Rome, 123

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Copyright information

© 1975 D. K. Bowen and C. R. Hall

About this chapter

Cite this chapter

Bowen, D.K., Hall, C.R. (1975). Unconventional and New Techniques. In: Microscopy of Materials. Palgrave, London. https://doi.org/10.1007/978-1-349-15601-6_8

Download citation

Publish with us

Policies and ethics