Abstract
The operation of the transmission electron microscope depends primarily upon the fact noted in chapter 2, that fast electrons are deflected by magnetic fields and can be focused by suitably constructed magnetic lenses. Thus in principle electrons can be used in the same way as light to form a magnified image of an object, but with the possibility that, since the wavelengths of the waves representing fast electrons are so short (3.7 pm at 100 keV) the resolution will be much higher than is possible with an optical microscope.
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© 1975 D. K. Bowen and C. R. Hall
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Bowen, D.K., Hall, C.R. (1975). The Electron Microscope. In: Microscopy of Materials. Palgrave, London. https://doi.org/10.1007/978-1-349-15601-6_4
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DOI: https://doi.org/10.1007/978-1-349-15601-6_4
Publisher Name: Palgrave, London
Print ISBN: 978-0-333-18703-6
Online ISBN: 978-1-349-15601-6
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