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Trace analysis — derivation of detection limit expression

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Worked Examples in X-Ray Analysis

Part of the book series: Philips Technical Library ((PTL))

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Abstract

The lower limit of detection is often defined as that concentration equal to two standard deviations of the background count rate. Derive an ex­pression which defines the lower limit of detection in terms of the anal­ysis time T, the background counting rate R b and the response m of an element given in c/s per %. Remember that trace analysis always re­quires two measurements, i.e. peak plus background.

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© 1978 N.V. Philips’ Gloeilampenfabrieken

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Jenkins, R., de Vries, J.L. (1978). Trace analysis — derivation of detection limit expression. In: Worked Examples in X-Ray Analysis. Philips Technical Library. Palgrave, London. https://doi.org/10.1007/978-1-349-03534-2_19

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