Abstract
A diffractometer trace is recorded of a compound known to contain a high concentration of Ba. The pattern is characterized by a very strong line with a d -spacing of 3.08 Å, plus many others. A weak, broad line was observed above a rather high background at approximately 6.5 o(2θ). It was suspected from the shape of this line that it did not belong to the regular diffraction pattern. Can there be an alternative explanation for this line.
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© 1978 N.V. Philips’ Gloeilampenfabrieken
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Jenkins, R., de Vries, J.L. (1978). Extra lines in X-ray diffractometry. In: Worked Examples in X-Ray Analysis. Philips Technical Library. Palgrave, London. https://doi.org/10.1007/978-1-349-03534-2_16
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DOI: https://doi.org/10.1007/978-1-349-03534-2_16
Publisher Name: Palgrave, London
Print ISBN: 978-1-349-03536-6
Online ISBN: 978-1-349-03534-2
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