Abstract
The basic material of a field-effect transistor is a chemically pure and perfect single crystal of silicon. In such a crystal the atoms are ordered in a periodic pattern such that they are all lined up perfectly throughout the entire lattice. Silicon is a tetravalent element so that Si atoms sit at the apices and at the centre of tetrahedra in the lattice. Therefore a single crystal of silicon when seen from a particular direction appears as shown in figure 1.1. The electrical characteristics of such crystals are best described with the help of energy band models, tools derived from band theory.
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Further Reading
A. S. Grove, Physics and Technology of Semiconductor Devices, Wiley, New York (1967)
S. M. Sze, Physics of Semiconductor Devices, Wiley-Interscience, New York (1969)
E. Kooi, The Surface Properties of Oxidized Silicon, Springer-Verlag, New York (1967)
A. Many, Y. Goldstein, N. B. Grover, Semiconductor Surfaces, Elsevier, New York (1965)
D. R. Frankl, Electrical Properties of Semiconductor Surfaces, Pergamon, London (1967)
A. G. Revesz, K. H. Zaininger. The Si-SiO, solid—solid interface system. RCA Rev. 29 (1968) 22
P. V. Gray. The silicon—silicon dioxide system. Proc. IEEE 57 (1969) 1543
A. Goetzberger. Ideal MOS curves for silicon. Bell Syst. tech. J. 45 (1966) 1097
E. Arnold. Surface charges and surface potential in silicon surface inversion layers. IEEE Trans. Electron Devices, ED-15 (1968) 1003
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© 1974 J. T. Wallmark and L. G. Carlstedt
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Wallmark, J.T., Carlstedt, L.G. (1974). Properties of Semiconductors. In: Field-Effect Transistors in Integrated Circuits. Palgrave, London. https://doi.org/10.1007/978-1-349-02053-9_2
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DOI: https://doi.org/10.1007/978-1-349-02053-9_2
Publisher Name: Palgrave, London
Print ISBN: 978-1-349-02055-3
Online ISBN: 978-1-349-02053-9
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