Abstract
Semiconductor manufacturers of power diodes and thyristors, like other component manufacturers put their products through rigorous tests before the customer receives them. It is essential that these tests are understood before discussing any tests that semiconductor users may apply. The nomenclature and symbols used in the test are those given in BS9300:1969
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Bibliography
For further details of test methods and procedures covering diode and thyristor testing refer to BS9300:1969 Specification for semiconductor devices of assessed quality: Generic data and method of test.
For further reading SCR Manual, General Electric Company, Editor F. W. Gutzwiller
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© 1972 Macmillan Publishers Limited
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Eveleigh, R.D. (1972). Power Semiconductors. In: Waller, W.F. (eds) Electronics Testing & Measurement. Macmillan Engineering Evaluations. Palgrave, London. https://doi.org/10.1007/978-1-349-01191-9_5
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DOI: https://doi.org/10.1007/978-1-349-01191-9_5
Publisher Name: Palgrave, London
Print ISBN: 978-1-349-01193-3
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