Abstract
Most of the current dispatching approaches for complex manufacturing facilities like semiconductor fabs are related to due dates. They are variants of classical dispatching rules such as Critical Ratio (CR), Apparent Tardiness Cost (ATC), or Operation Due Date (ODD). Besides that there are a number of operational control policies which target the control of the inventory level of the work centers such as Kanban, Starvation Avoidance, or Minimum Inventory Variability Scheduler (MIVS). While the first set of dispatching rules does not primarily lead to low inventory levels, the latter ones do not always lead to good on-time delivery performance. We are currently developing an approach which combines both ideas, i.e., keeping a low WIP level, avoiding bottleneck starvation, and meeting the due dates. While due dates are usually given by the planning department, adequate WIP levels usually have to be set appropriately by means of pilot studies or educated guessing. As a consequence, an adaptive procedure to determine the adequate inventory levels should be implemented. In our contribution, we provide an overview of current dispatching approaches of both types and discuss their pros and cons. Then, we present our approach in detail and compare its performance with the classical approaches from the literature. Recently, we were able to outperform ODD with respect to WIP levels while having the same on-time delivery performance. The disadvantage is that the optimal target WIP levels (minimum and maximum workload level for the work centers) had to be set experimentally. In our future study, we intend to develop a back-propagation neural network for adaptive parameter setting.
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References
Atherton LF,  Atherton RW (1995) Wafer fabrication: factory performance and analysis. Kluwer, Boston
Bertrand JWM (1983) The use of work load information to control job lateness in controlled and uncontrolled release production systems. J Oper Manag 3:79–92
Baker KR, Bertrand JWM (1981) A comparison of due-date selection rules. AIIE Trans 13: 123–13
Baker KR, Bertrand JWM (1981) An investigation of due date assignment rules with constrained tightness. J Oper Manag 1:109–120
Burman DY, Gurrola-Gal FJ, Nozari A, Sathaye S, Sitarik JP (1986) Performance analysis techniques for ic manufacturing lines. AT&T Tech J 65:46–57
Chambers M, Mount-Campbell CA (2002) Process optimization via neural network metamodeling. Int J Prod Econ 79:93–100
Collins DW, Palmeri V (1997) An analysis of the “k-step ahead minimum inventory variability policy using sematech semiconductor manufacturing data in a discrete-event simulation model. In: 6th International Conference on Emerging Technologies and Factory Automation Proceedings, pp 520–527.
Dabbas RM, Fowler JW (2003) A new scheduling approach using combined dispatching criteria in wafer fabs. IEEE Trans Semicond Manuf 16:501–510
Elvers DA (1973) Job shop dispatching rules using various delivery date setting criteria. Prod Invent Manag 4:62–70
Hopp WJ, Spearman ML (2001) Factory physics: foundations of manufacturing management, 2nd ed. Irwin McGraw-Hill, London
Kuo CJ, Liu CM, Chi CY (2008) Standard wip determination and wip balance control with time constraints in semiconductor wafer fabrication. J Qual 15:409–423
Li S, Tang T, Collins DW (1996) Minimum inventory variability scheduler with applications in semiconductor manufacturing. IEEE Trans Semicond Manuf 9:1–5
Little JDC (1992) Are there ‘Laws’ of manufacturing. manufacturing systems: foundations of world-class practice, pp 180–188
Fowler JW, Hogg GL, Mason SJ (2002) Workload control in the semiconductor industry. Prod Plan Control 13:568–578
Fowler J, Robinson J (1995) Measurement and improvement of manufacturing capacities (MIMAC): final report. Technical Report 95062861A-TR, Austin, TX: SEMATECH
Glassey CR, Resende MGC (1988) Closed-loop job release control for VLSI circuit manufacturing. IEEE Trans Semicond Manuf 1:36–46
Goldratt EM (1984) The goal. Great Barrington, MA
Goldratt EM, Cox J (1986) The goal: a process of ongoing improvement. North River Press, New York
Ham M, Fowler JW (2007) Balanced machine workload dispatching scheme for wafer fab. Advanced semiconductor manufacturing conference, pp 390–395
Kalisch S, Ringel R, Weigang J (2008) Managing wip and cycle time with the help of loop control. In: Proceedings of the 2008 winter simulation conference, pp 2298–2304
Marek RP, Elkins DA, Smith DR (2001) Understanding the fundamentals of kanban and conwip pull systems using simulation. In: Proceedings of the 2001 winter simulation conference, pp 921–929
Monden Y (1981) What makes the toyota production system really tick. Ind Eng 13:36–46
Muhlemann AP, Lockett AG, Farn CI (1982) Job shop scheduling heuristics and frequency of scheduling. Int J Prod Res 20:227–241
Pai FY (2004) Wip management model for semiconductor back-end manufacturing. J Am Acad Bus 5:357–363
PanWalker SS, Iskandar WW (1977) A survey of scheduling rules. Oper Res 1:45–61
Perdaen D, Armbruster D, Kempf K, Lefeber E (2008) Controlling a reentrant manufacturing line via the push-pull point. Int J Prod Res 46(16):4521–4536
Rose O (2002) Some issues of the critical ratio dispatch rule. In: Proceedings of the 2002 winter simulation conference, pp 1401–1405
Rose O (2003) Comparison of due-date oriented dispatch rules in semiconductor manufacturing. In: Proceedings of the 2003 industrial engineering research conference, pp 18–20
Spearman ML, Zazanis MA (1992) Push and pull production systems: issues and comparisons. Oper Res 40:521–532
Spearman ML, Woodruff DL, Hopp WJ (1990) CONWIP: a pull alternative to kanban. Int J Prod Res 28:879–894
Vepsalainen APJ, Morton TE (1987) Priority rules for job shops with weighted tardiness costs. Manag Sci 33:1035–1047
Wein LM (1988) Scheduling semiconductor wafer fabrication. IEEE Trans Semicond Manuf 1:115–129
Wight OW (1970) Input/output control: a real handle on lead time. Prod Invent Manag J 11:9–31
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Rose, O., Zhou, Z. (2012). WIP-Oriented Dispatching in Complex Manufacturing Facilities. In: Armbruster, D., Kempf, K. (eds) Decision Policies for Production Networks. Springer, London. https://doi.org/10.1007/978-0-85729-644-3_4
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DOI: https://doi.org/10.1007/978-0-85729-644-3_4
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