Methodologies for Performance Enhancing
Measurements can be affected by errors related to many sources, such as technological features of the measuring instrument, measurement procedure and conditions, and operator’s skill. Metrological performance of an instrument can be significantly enhanced by developing a correction model, able to compensate for recognized systematic errors. After an introduction to the concept of error correction, the core of this chapter is the presentation of a methodology aimed at identifying and correcting some of the most influential systematic errors. In particular, the case of MScMS-I is analysed in detail. Finally, some general ideas about the construction of homologous models for other large-scale metrology distributed systems (i.e., the MScMS-II and the iGPS™) are given.