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Methodologies for Performance Enhancing

  • Fiorenzo Franceschini
  • Maurizio Galetto
  • Domenico Maisano
  • Luca Mastrogiacomo
  • Barbara Pralio
Chapter

Abstract

Measurements can be affected by errors related to many sources, such as technological features of the measuring instrument, measurement procedure and conditions, and operator’s skill. Metrological performance of an instrument can be significantly enhanced by developing a correction model, able to compensate for recognized systematic errors. After an introduction to the concept of error correction, the core of this chapter is the presentation of a methodology aimed at identifying and correcting some of the most influential systematic errors. In particular, the case of MScMS-I is analysed in detail. Finally, some general ideas about the construction of homologous models for other large-scale metrology distributed systems (i.e., the MScMS-II and the iGPS™) are given.

Keywords

Correction Model Receive Signal Strength Network Device Misalignment Angle Factorial Plan 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Springer-Verlag London Limited 2011

Authors and Affiliations

  • Fiorenzo Franceschini
    • 1
  • Maurizio Galetto
    • 1
  • Domenico Maisano
    • 1
  • Luca Mastrogiacomo
    • 1
  • Barbara Pralio
    • 1
  1. 1.Dipto. di Sistemi di Produzione e Econom (Department of Production Systems and Bu)POLITECNICO di TORINOTurinItaly

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