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Multi-sample Models

  • N. Balakrishnan
  • Erhard Cramer
Chapter
Part of the Statistics for Industry and Technology book series (SIT)

Abstract

Several models involving multiple samples based on progressively Type-II censored data are discussed. The presentation includes competing risk models, joint progressive censoring, concomitants, and progressively censored systems data.

Keywords

Cumulative Distribution Function Weibull Distribution Bivariate Normal Distribution Compete Risk Model Joint Density Function 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  • N. Balakrishnan
    • 1
  • Erhard Cramer
    • 2
  1. 1.Department of Mathematics and StatisticsMcMaster UniversityHamiltonCanada
  2. 2.Institute of StatisticsRWTH Aachen UniversityAachenGermany

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