Abstract
Methods of accelerated life testing are applied to several kinds of progressively censored data. This includes step-stress testing as well as progressive stress models.
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References
Abdel-Hamid AH (2009) Constant-partially accelerated life tests for Burr type-XII distribution with progressive type-II censoring. Comput Stat Data Anal 53:2511–2523
Abdel-Hamid AH, AL-Hussaini EK (2011) Inference for a progressive stress model from Weibull distribution under progressive type-II censoring. J Comput Appl Math 235: 5259–5271
Abdel-Hamid AH, AL-Hussaini EK (2014) Bayesian prediction for Type-II progressive censored data from the Rayleigh distribution under progressive-stress model. J Stat Comput Simul 84:1297–1312
Abushal TA, Soliman AA (2013) Estimating the Pareto parameters under progressive censoring data for constant-partially accelerated life tests. J Stat Comput Simul (to appear)
Bagdonavičius V (1978) Testing the hypothesis of additive accumulation of damages. Probab Theory Appl 23:403–408
Bagdonavičius V, Nikulin M (2002) Accelerated life models: modeling and statistical analysis. Chapman & Hall/CRC Press, Boca Raton/Florida
Bagdonavičius V, Cheminade O, Nikulin M (2004) Statistical planning and inference in accelerated life testing using the CHSS model. J Stat Plan Infer 126:535–551
Bai DS, Kim MS, Lee SH (1989) Optimum simple step-stress accelerated life tests with censoring. IEEE Trans Reliab 38:528–532
Balakrishnan N (2009) A synthesis of exact inferential results for exponential step-stress models and associated optimal accelerated life-tests. Metrika 69:351–396
Balakrishnan N, Han D (2009) Optimal step-stress testing for progressively Type-I censored data from exponential distribution. J Stat Plan Infer 139:1782–1798
Balakrishnan N, Iliopoulos G (2010) Stochastic monotonicity of the MLEs of parameters in exponential simple step-stress models under Type-I and Type-II censoring. Metrika 72: 89–109
Balakrishnan N, Cramer E, Kamps U, Schenk N (2001b) Progressive type II censored order statistics from exponential distributions. Statistics 35:537–556
Balakrishnan N, Kamps U, Kateri M (2012b) A sequential order statistics approach to step-stress testing. Ann Inst Stat Math 64:303–318
Balakrishnan N, Cramer E, Iliopoulos G (2014) On the method of pivoting the CDF for exact confidence intervals with illustration for exponential mean under life-test with time constraints. Stat Probab Lett 89:124–130
Basu AP (1995) Accelerated life testing with applications. In: Balakrishnan N, Basu AP (eds) The exponential distribution: theory, methods and applications. Gordon and Breach, Newark, pp 377–383
Beutner E (2007) Progressive type-II censoring and transition kernels. Comm Dependability Qual Manag 10:25–32
Bhattacharyya GK, Soejoeti Z (1989) A tampered failure rate model for step-stress accelerated life test. Comm Stat Theory Meth 18:1627–1643
Cramer E, Kamps U (1998) Sequential k-out-of-n systems with Weibull components. Econ Qual Control 13:227–239
Cramer E, Kamps U (2003) Marginal distributions of sequential and generalized order statistics. Metrika 58:293–310
Davis DJ (1952) An analysis of some failure data. J Am Stat Assoc 47:113–150
Ding C, Tse SK (2013) Design of accelerated life test plans under progressive Type II interval censoring with random removals. J Stat Comput Simul 83:1330–1343
Ding C, Yang C, Tse SK (2010) Accelerated life test sampling plans for the Weibull distribution under Type I progressive interval censoring with random removals. J Stat Comput Simul 80:903–914
Fan TH, Wang WL, Balakrishnan N (2008) Exponential progressive step-stress life-testing with link function based on Box-Cox transformation. J Stat Plan Infer 138:2340–2354
Gouno E, Balakrishnan N (2001) Step-stress accelerated life test. In: Balakrishnan N, Rao CR (eds) Handbook of statistics. Advances in reliability, vol 20. North Holland, Amsterdam, pp 623–639
Gouno E, Sen A, Balakrishnan N (2004) Optimal step-stress test under progressive Type-I censoring. IEEE Trans Reliab 53:388–393
Han D, Balakrishnan N, Sen A, Gouno E (2006) Corrections on ‘Optimal step-stress test under progressive Type-I censoring’. IEEE Trans Reliab 55:613–614
Kamps U (1995a) A concept of generalized order statistics. Teubner, Stuttgart
Kamps U (1995b) A concept of generalized order statistics. J Stat Plan Infer 48:1–23
Kateri M, Balakrishnan N (2008) Inference for a simple step-stress model with Type-II censoring, and Weibull distributed lifetimes. IEEE Trans Reliab 57:616–626
Khamis I, Higgins J (1998) A new model for step-stress testing. IEEE Trans Reliab 47: 131–134
Kundu D, Balakrishnan N (2009) Point and interval estimation for a simple step-stress model with random stress-change time. J Probab Stat Sci 7:113–126
Lai CD, Xie M, Murthy DNP (2003) A modified Weibull distribution. IEEE Trans Reliab 52:33–37
Lu Y, Storer B (2001) A tampered Brownian motion process model for partial step-stress accelerated life testing. J Stat Plan Infer 94:15–24
Madi MT (1993) Multiple step-stress accelerated life test: the tampered failure rate model. Comm Stat Theory Meth 22:295–306
McNichols D, Padgett W (1988) Inference for step-stress accelerated life tests under arbitrary right-censorship. J Stat Plan Infer 20:169–179
Meeker WQ, Escobar LA (1998) Statistical methods for reliability data. Wiley, New York
Meeker WQ, Hahn GJ (1985) How to Plan accelerated life tests. ASQC basic references in quality control: statistical techniques, vol 10. The American Society for Quality Control, Milwaukee
Miller R, Nelson W (1983) Optimum simple step-stress plans for accelerated life testing. IEEE Trans Reliab R-32:59–65
Nelson W (1980) Accelerated life testing: step-stress models and data analyses. IEEE Trans Reliab R-29:103–108
Nelson W (1990) Accelerated testing: statistical models, test plans, and data analyses. Wiley, Hoboken
Nelson W, Meeker WQ (1978) Theory for optimum accelerated censored life tests for Weibull and extreme value distributions. Technometrics 20:171–177
Sedyakin NM (1966) On one physical principle in reliability theory (in Russian). Tech Cybern 3:80–87
Shaked M, Singpurwalla ND (1983) Inference for step-stress accelerated life tests. J Stat Plan Infer 7:295–306
Shen KF, Shen YJ, Leu LY (2011) Design of optimal step-stress accelerated life tests under progressive type I censoring with random removals. Qual Quant 45:587–597
Sun T, Shi Y, Dang S (2012) Inference for Burr-XII with progressive Type-II censoring with random removals in step-stress partially accelerated life test. In: 2012 international conference on quality, reliability, risk, maintenance, and safety engineering (ICQR2MSE), pp 889–894
Tang LC (2003) Multiple steps step-stress accelerated. In: Pham H (ed) Handbook of reliability engineering. Springer, New York, pp 441–455
Tse SK, Ding C, Yang C (2008) Optimal accelerated life tests under interval censoring with random removals: the case of Weibull failure distribution. Statistics 42:435–451
Van Dorp JR, Mazzuchi TA (2004) A general Bayes exponential inference model for accelerated life testing. J Stat Plan Infer 119:55–74
Wang BX (2010) Interval estimation for exponential progressive Type-II censored step-stress accelerated life-testing. J Stat Plan Infer 140:2706–2718
Wang BX, Yu K (2009) Optimum plan for step-stress model with progressive Type-II censoring. TEST 18:115–135
Watkins AJ (2001) Commentary: inference in simple step-stress models. IEEE Trans Reliab 50:36–37
Wu SJ, Lin YP, Chen YJ (2006c) Planning step-stress life test with progressively type I group-censored exponential data. Stat Neerl 60:46–56
Wu SJ, Lin YP, Chen ST (2008a) Optimal step-stress test under type I progressive group-censoring with random removals. J Stat Plan Infer 138:817–826
Xie Q, Balakrishnan N, Han D (2008) Exact inference and optimal censoring scheme for a simple step-stress model under progressive Type-II censoring. In: Balakrishnan N (ed) Advances in mathematical and statistical modeling. Birkhäuser, Boston, pp 107–137
Xiong C (1998) Inferences on a simple step-stress model with type-II censored exponential data. IEEE Trans Reliab 47:142–146
Xiong C, Ji M (2004) Analysis of grouped and censored data from step-stress life test. IEEE Trans Reliab 53:22–28
Xiong C, Milliken G (1999) Step-stress life-testing with random stress-change times for exponential data. IEEE Trans Reliab 48:141–148
Yang C, Tse SK (2005) Planning accelerated life tests under progressive Type I interval censoring with random removals. Comm Stat Simul Comput 34:1001–1025
Yue HB, Shi YM (2013) Optimal sample size allocation for multi-level stress testing under progressive hybrid interval censoring. Appl Mech Mater 423–426:2423–2426
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Balakrishnan, N., Cramer, E. (2014). Accelerated Life Testing. In: The Art of Progressive Censoring. Statistics for Industry and Technology. Birkhäuser, New York, NY. https://doi.org/10.1007/978-0-8176-4807-7_23
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DOI: https://doi.org/10.1007/978-0-8176-4807-7_23
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