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Acceptance Sampling Plans

  • N. Balakrishnan
  • Erhard Cramer
Chapter
Part of the Statistics for Industry and Technology book series (SIT)

Abstract

Results for reliability/acceptance sampling plans based on progressively Type-II censored data are reviewed. This includes results for exponential, Weibull, and log-normal lifetimes. Furthermore, capability indices are discussed.

Keywords

Sampling Plan Capability Index Lifetime Data Interval Censor Data Lower Specification Limit 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  • N. Balakrishnan
    • 1
  • Erhard Cramer
    • 2
  1. 1.Department of Mathematics and StatisticsMcMaster UniversityHamiltonCanada
  2. 2.Institute of StatisticsRWTH Aachen UniversityAachenGermany

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