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Scan Statistics in Genome-Wide Scan for Complex Trait Loci

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Abstract

In genome-wide genetic scans for disease susceptibility loci, true peaks have been shown to be wider than false peaks. We describe scan statistics to make use of this extra information, which is not generally taken into account otherwise. Our methods are applied to four disease datasets.

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© 2009 Birkhäuser Boston, a part of Springer Science+Business Media, LLC

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Hoh, J., Ott, J. (2009). Scan Statistics in Genome-Wide Scan for Complex Trait Loci. In: Glaz, J., Pozdnyakov, V., Wallenstein, S. (eds) Scan Statistics. Statistics for Industry and Technology. Birkhäuser Boston. https://doi.org/10.1007/978-0-8176-4749-0_9

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