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Joseph Naus: Father of the Scan Statistic

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Scan Statistics

Part of the book series: Statistics for Industry and Technology ((SIT))

Abstract

Currently, the literature on the scan statistic is vast, growing exponentially in diverse directions, with contributions by many researchers and groups. As time goes on, the early history of the problem bears telling. Joseph Naus, the father of the scan statistic, originated the modern work on the topic. The process took almost twenty years to reach maturity; I have chosen Naus (1982) as the definition of this maturity. The very name “scan statistic” does not appear to have become attached to the problem for fifteen years, and the interconnections to what is now one problem, in both statement of the problem and common methods of solution, was far from obvious originally. This chapter will not attempt a full review of all of Naus’s statistical contributions, or even a full review of his contributions as they concern the scan statistic. Instead, it will focus on a few themes that had already originated in Naus’s first twenty years of written research (1962–1982), and briefly continue with those threads to the present. Since these early themes include such general issues as applications of the scan statistic, mentoring graduate students, and specific methodological issues, the review will encompass a significant portion of Dr. Naus’s research, without making claim to being exhaustive regarding either his research or the much broader topic of research he influenced on the scan statistic.

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Author information

Authors and Affiliations

  1. Department of Community and Preventive Medicine, Mount Sinai School of Medicine, New York, NY, USA

    Sylvan Wallenstein

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  1. Sylvan Wallenstein
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Editor information

Editors and Affiliations

  1. Dept. Statistics, University of Connecticut, Glenbrook Rd. 215, Storrs, 06269-3120, U.S.A.

    Joseph Glaz

  2. Dept. Statistics, University of Connecticut, Glenbrook Road 215, Storrs, 06269-4120, U.S.A.

    Vladimir Pozdnyakov

  3. Center for Biomathematical Sciences, Mount Sinai School of Medicine, Gustave L Levy Place 1, New York, 10029, U.S.A.

    Sylvan Wallenstein

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Wallenstein, S. (2009). Joseph Naus: Father of the Scan Statistic. In: Glaz, J., Pozdnyakov, V., Wallenstein, S. (eds) Scan Statistics. Statistics for Industry and Technology. Birkhäuser Boston. https://doi.org/10.1007/978-0-8176-4749-0_1

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