Integral Equation Modeling of Electrostatic Interactions in Atomic Force Microscopy

  • Y. Shen
  • D.M. Barnett
  • P.M. Pinsky


Atomic Force Microscope Image Boundary Element Method Boundary Integral Equation Surface Charge Density Conductive Sample 
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Copyright information

© Birkhäuser Boston 2008

Authors and Affiliations

  • Y. Shen
    • 1
  • D.M. Barnett
    • 1
  • P.M. Pinsky
    • 1
  1. 1.Stanford UniversityUSA

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