Artifacts in Transmission Electron Microscopy

  • Jeanne Ayache
  • Luc Beaunier
  • Jacqueline Boumendil
  • Gabrielle Ehret
  • Danièle Laub


An artifact is damage caused by a preparation technique and can easily be confused with the sample’s microstructure. Artifacts can be due to mechanical, chemical, ionic, or physical action. During TEM observation, especially in a TEM/STEM, other artifacts may be produced due to irradiation under the electron beam.


Thermal Effect Electronic Irradiation Mechanical Polishing Chemical Fixation Crystal Network 
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© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  • Jeanne Ayache
    • 1
  • Luc Beaunier
    • 2
  • Jacqueline Boumendil
    • 3
  • Gabrielle Ehret
    • 4
  • Danièle Laub
    • 5
  1. 1.Laboratoire de Microscopie Moléculaire et CellulaireInstitut Gustave Roussy Unité mixte CNRS-UMR8126-IGRVillejuif CXFrance
  2. 2.Labo. Interfaces et Systèmes ElectrochimiquesUniversité Paris VI UPR 15 CNRS Boîte courrier 133Paris CX 05France
  3. 3.Centre de Microscopie Electronique Appliquée à la Biologie et à la GéologieUniversité Lyon IVilleurbanne CXFrance
  4. 4.Inst. Physique et Chimie des MatériauxUniversité Strasbourg CNRS-UMR 7504Strasbourg CX 2France
  5. 5.Faculté des Sciences de Base Centre Interdisciplinaire de Microscopie ElectroniqueEcole Polytechnique Fédérale de LausanneLausanneSwitzerland

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