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Materials Problems and Approaches for TEM and TEM/STEM Analyses

  • Jeanne Ayache
  • Luc Beaunier
  • Jacqueline Boumendil
  • Gabrielle Ehret
  • Danièle Laub
Chapter

Abstract

Characterizing a material’s microstructure comes down to determining the morphological, textural, structural, and chemical parameters of this material. To respond to a problem presented by a given material, it is necessary to define the pertinent scale for investigating its microstructure. Before beginning a microstructure investigation using transmission electron microscopy, one must first determine the results obtained at a larger scale by using several types of analyses at different locations in the material using different spatial resolutions.

Keywords

Electron Energy Loss Spectroscopy Crystal Defect Specimen Holder Multilayer Material Atomic Column 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  • Jeanne Ayache
    • 1
  • Luc Beaunier
    • 2
  • Jacqueline Boumendil
    • 3
  • Gabrielle Ehret
    • 4
  • Danièle Laub
    • 5
  1. 1.Laboratoire de Microscopie Moléculaire et CellulaireInstitut Gustave Roussy Unité mixte CNRS-UMR8126-IGRVillejuif CXFrance
  2. 2.Labo. Interfaces et Systèmes ElectrochimiquesUniversité Paris VI UPR 15 CNRS Boîte courrier 133Paris CX 05France
  3. 3.Centre de Microscopie Electronique Appliquée à la Biologie et à la GéologieUniversité Lyon IVilleurbanne CXFrance
  4. 4.Inst. Physique et Chimie des MatériauxUniversité Strasbourg CNRS-UMR 7504Strasbourg CX 2France
  5. 5.Faculté des Sciences de Base Centre Interdisciplinaire de Microscopie ElectroniqueEcole Polytechnique Fédérale de LausanneLausanneSwitzerland

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