Abstract
Electron microscopy constitutes a key technique for characterizing materials because of its various imaging and spectrometry options. Depending on the scale and nature of the information desired (topographical, morphological, structural, and/or chemical), either scanning and/or transmission electron microscopy is used.
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Ayache, J., Beaunier, L., Boumendil, J., Ehret, G., Laub, D. (2010). The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM). In: Sample Preparation Handbook for Transmission Electron Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-98182-6_3
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DOI: https://doi.org/10.1007/978-0-387-98182-6_3
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