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Modeling and characterization

  • Ioannis Kymissis
Chapter
Part of the Integrated Circuits and Systems book series (ICIR)

Keywords

Contact Resistance Threshold Voltage Gate Voltage Channel Capacitance Gate Bias 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  1. 1.Columbia UniversityUSA

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