Advertisement

Phase Identification Through Symmetry Determination in EBSD Patterns

  • David J. Dingley
  • S.I. Wright
Chapter

Introduction

The established use of electron backscatter diffraction (EBSD) is now widespread in orientation determination, orientation mapping (OIM), and when coupled with X-ray energy dispersive chemical analysis (EDS), as a tool for phase discrimination (Schwartz et al. 2000). A look back at the early application of the technique, before full automation, shows that it was used primarily for extracting the symmetry elements of an unknown crystal phase. The approach is detailed in Chapter 3 of An Atlas of Wide Angle Kikuchi Patterns (Dingley et al. 1994) and applied extensively to an investigation of an anomalous thin film growing on the surface of a synthetic nickel sulfide crystal (Baba-Kishi and Dingley 1987). Both point group and space group symmetries were extracted. The fundamental limitations that arise from the backscatter diffraction process itself have been discussed by Baba-Kishi (1986) and Dingley et al. (1994). In particular, whereas electron diffraction is exempt from...

Keywords

Crystal System Crystal Class EBSD Pattern Phase Discrimination Kikuchi Line 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

References

  1. Baba-Kishi KZ (1986) Crystallographic information from electron back-scattering diffraction patterns. Ph.D. Thesis, Bristol University, Bristol, UKGoogle Scholar
  2. Baba-Kishi KZ, Dingley DJ (1987) Application of backscatter Kikuchi diffraction in the SEM to studies of NiS. J Appl Crystallogr 22:89–98Google Scholar
  3. Baba-Kishi KZ, Dingley DJ (1989) Backscatter Kikuchi diffraction in the SEM for identification of crystallographic point groups. Scanning 11(6):305–312Google Scholar
  4. Dingley DJ, Baba-Kishi K, Randle V (1994) Atlas of backscatter Kikuchi diffraction patterns. Institute of Physics Publishing, Bristol, UKGoogle Scholar
  5. Michael, JR (2000) Phase identification using electron backscatter diffraction in the scanning electron microscope. In: Schwartz AJ, Kumar M, Adams BL (eds) Electron backscatter diffraction in materials science. Kluwer Academic/Plenum Publishers, New YorkGoogle Scholar
  6. Schwartz AJ, Kumar M, Adams, BL (2000) Electron backscatter diffraction in materials science. Kluwer Academic/Plenum Publishers, New YorkGoogle Scholar
  7. Winkelmann A, Trager-Cowan C, Sweeney F, Day AP, Parbrook P (2007) Many-beam dynamical simulation of electron backscatter diffraction patterns. Ultramicroscopy 107: 414–421CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  1. 1.H. H. Wills Physics LaboratoryBristol UniversityBristolUK
  2. 2.EDAX-TSLDraperUSA

Personalised recommendations