Application of Electron Backscatter Diffraction to Phase Identification

  • Bassem El-Dasher
  • Andrew Deal

The distribution, morphology, and stability of material phases govern the bulk properties of virtually all of the technologically relevant materials used to design engineering components and products. Phase identification and characterization are therefore critical to the development and use of practical materials. In this chapter, we will focus on the application of electron backscatter diffraction (EBSD) to phase identification.


Phase Identification Manual Scrutiny EBSD Pattern Phase Discrimination Topologically Close Packed 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.



Part of this work was performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory, in part under Contract W-7405-Eng-48 and in part under Contract DE-AC52-07NA27344.


  1. Baba-Kishi KZ (1998) Measurement of crystal parameters on backscatter Kikuchi diffraction patterns. Scanning 20: 117–127CrossRefGoogle Scholar
  2. Baba-Kishi KZ (2002) Review: Electron backscatter Kikuchi diffraction in the scanning electron microscope for crystallographic analyses. J Mater Sci 37:1715–1746CrossRefGoogle Scholar
  3. Baba-Kishi KZ, Dingley DJ (1989a) Backscatter Kikuchi diffraction in the SEM for identification of crystallographic point groups. Scanning 11:305–312Google Scholar
  4. Baba-Kishi KZ, Dingley DJ (1989b) Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS2. J Appl Cryst 22:189–200CrossRefGoogle Scholar
  5. Cieslak MJ, Headley TJ, Romig AD Jr (1986) The welding metallurgy of HASTELLOY alloys C-4, C-22, and C-276. Metall Trans A 17A:2035–2047ADSGoogle Scholar
  6. Davis JR (ed) (1997) Heat resistant materials. ASM Specialty Handbook. ASM International, Materials Park, OHGoogle Scholar
  7. Goehner RP, Michael JR (1996) Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns. J Res Natl Inst Stand Technol 101:301–308Google Scholar
  8. Gourgues-Lorenzon AF (2007) Application of electron backscatter diffraction to the study of phase transformations. Int Mater Rev 52:65–128CrossRefGoogle Scholar
  9. Heubner UL, Altpeter E, Rockel MB et al (1989) Electrochemical behavior and its relation to composition and sensitization of NiCrMo alloys in ASTM G-28 solution. Corrosion 42:249–259Google Scholar
  10. Hodge FG, Kirchner RW (1976) An improved Ni–Cr–Mo alloy for corrosion service. Corrosion 32:332–336Google Scholar
  11. Leonard RB (1969) Thermal stability of Hastelloy alloy C-276. Corrosion 25:222–228Google Scholar
  12. Michael JR, Eades JA (2000) Use of reciprocal lattice layer spacing in electron backscatter diffraction pattern analysis. Ultramicroscopy 81:67–81CrossRefPubMedGoogle Scholar
  13. Raghavan M, Berkowitz BJ, Scanlon JC (1982) Electron microscopic analysis of heterogeneous precipitates in Hastelloy C-276. Metall Trans A 13A:979–984ADSGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  1. 1.Lawrence Livermore National LaboratoryLivermoreUSA

Personalised recommendations