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Characterization of Shear Localization and Shock Damage with EBSD

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Electron Backscatter Diffraction in Materials Science

This chapter provides examples of the application of EBSD characterization to microstructures influenced by two conditions: (1) shear localization, and (2) dynamic deformation and damage from shock loading.

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Acknowledgments

Los Alamos National Laboratory (LANL) is operated by Los Alamos National Security, LLC, for the National Nuclear Security Administration of the U.S. Department of Energy under contract DE-AC52-06NA25396. The authors wish to thank Carl Trujillo, Anna Breiner, Mike Lopez, and Anna Zurek of LANL, Ben Henrie of Stanley Associates, and Daniel Worthington of the University of Texas at Austin for their contributions with experimental and characterization aspects of this work. Paulo Rigg, Cynthia Schwartz, Robert Hixson, Alexander Saunders, Frank Merrill, Chris Morris, Kris Kwiatkowski, and the LANSCE Proton Radiography team at LANL are acknowledged for providing the HE-drive tantalum sample. Partial support was provided by the Joint DoD/DOE Munitions Technology Development Program.

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Authors and Affiliations

  1. Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA

    John F. Bingert, Veronica Livescu & Ellen K. Cerreta

Authors
  1. John F. Bingert
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  2. Veronica Livescu
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  3. Ellen K. Cerreta
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Corresponding author

Correspondence to John F. Bingert .

Editor information

Editors and Affiliations

  1. Physical Sciences Directorate, Lawrence Livermore National Laboratory, E. Ave. 7000, Livermore, 94550, U.S.A.

    Adam J. Schwartz

  2. Chemistry, Materials, Earth, & Life , Lawrence Livermore National Laboratory, East Ave. 7000, Livermore, 94550, U.S.A.

    Mukul Kumar

  3. Dept. Mechanical Engineering, Brigham Young University, Provo, 84602, U.S.A.

    Brent L. Adams

  4. School of Mechanical &, Washington State University, Pullman, 99164-2920, U.S.A.

    David P. Field

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Bingert, J.F., Livescu, V., Cerreta, E.K. (2009). Characterization of Shear Localization and Shock Damage with EBSD. In: Schwartz, A., Kumar, M., Adams, B., Field, D. (eds) Electron Backscatter Diffraction in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-88136-2_22

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