Mapping and Assessing Plastic Deformation Using EBSD
This chapter reviews approaches for mapping and assessing plastic deformation using EBSD. This discussion will be focused on the approaches based upon EBSD pattern rotation. Pattern rotation can be mapped or quantified in terms of straight orientation change, local misorientation, average misorientation, or the calculation of geometrically necessary dislocation densities. In polycrystals, the misorientation can be mapped using several different kinds of metrics to visualize plastic deformation around cracks, indentations, and inside deformed grains. We will discuss a number of average misorientation metrics that have been developed to quantify the correlation between plastic deformation and EBSD data. Finally, we will survey the more recent work in the measurement and display of geometrically necessary dislocations and their connection to deformation structures in metals.
KeywordsDislocation Density Reference Orientation Pattern Rotation EBSD Measurement EBSD Pattern
The authors wish to thank S. Wright of EDAX-TSL and C. Parish of Sandia National Laboratories for helpful discussion about this chapter. LNB was supported by Sandia National Laboratories, a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy (DOE) under contract DE-AC0494AL85000.
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