Measurement of the Five-Parameter Grain Boundary Distribution from Planar Sections

  • Gregory S. Rohrer
  • Valerie Randle

Although EBSD is essentially a surface measurement technique, strategies have been developed to extend its capabilities to the characterisation of microstructure in three dimensions. These developments have been realised because advances in both EBSD technology and computing power have rendered the collection of large data sets a routine matter. There are several scientific motivations for characterizing the three-dimensional structure of polycrystals by EBSD. In this chapter, we describe the application of EBSD to the measurement of internal interface planes by application of both serial sectioning and also a stereological technique known as the “five-parameter analysis.”


Boundary Plane Coincidence Site Lattice Twist Boundary Tilt Boundary Plane Distribution 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.



The work at Carnegie Mellon University was supported primarily by the MRSEC program of the National Science Foundation under Award Number DMR-0520425. The work at Swansea was partially supported by the Engineering and Physical Sciences Research Council.


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Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  1. 1.Department of Materials Science and EngineeringCarnegie Mellon UniversityPittsburghUSA

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