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Grain Boundary Networks

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Electron Backscatter Diffraction in Materials Science

Statistical information about grain orientations within a polycrystal has been available to materials researchers for many decades. In particular, the orientation distribution, or crystallographic texture information, has been measured using X-ray diffraction techniques since about 1950. Consequently, the role of texture in materials performance and design is widely appreciated and commonly taught in the core Materials Science curriculum. However, texture data represent only “one-point” statistics, and do not capture microstructural geometry or topology.

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Author information

Authors and Affiliations

  1. Lawrence Livermore National Laboratory, Livermore, CA 94550, USA

    Bryan W. Reed

  2. Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, USA

    Christopher A. Schuh

Authors
  1. Bryan W. Reed
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  2. Christopher A. Schuh
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Corresponding author

Correspondence to Bryan W. Reed .

Editor information

Editors and Affiliations

  1. Physical Sciences Directorate, Lawrence Livermore National Laboratory, E. Ave. 7000, Livermore, 94550, U.S.A.

    Adam J. Schwartz

  2. Chemistry, Materials, Earth, & Life , Lawrence Livermore National Laboratory, East Ave. 7000, Livermore, 94550, U.S.A.

    Mukul Kumar

  3. Dept. Mechanical Engineering, Brigham Young University, Provo, 84602, U.S.A.

    Brent L. Adams

  4. School of Mechanical &, Washington State University, Pullman, 99164-2920, U.S.A.

    David P. Field

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Reed, B.W., Schuh, C.A. (2009). Grain Boundary Networks. In: Schwartz, A., Kumar, M., Adams, B., Field, D. (eds) Electron Backscatter Diffraction in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-88136-2_15

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