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Second-Order Microstructure Sensitive Design Using 2-Point Spatial Correlations

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Electron Backscatter Diffraction in Materials Science

In this chapter we are concerned with second-order interrelations between structure, properties, and processes of materials. Structure can be described in many different ways. The most common metrics of structure involve “first-order” (volume fraction) information: for example, the orientation distribution function. Such metrics serve well as the basis for property relations that do not depend significantly upon the geometrical placement of the material constituents. However, many properties (such as those relating to failure) depend critically upon the geometrical distribution of particular material components, and hence benefit enormously from knowledge of the “higher order” structure.

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Acknowledgments

SK and DF acknowledge financial support for this work from the Office of Naval Research, Award No. N000140510504 (Program Manager: Dr. Julie Christodoulou). BA acknowledges funding provided by ARO, David Stepp, Program Manager.

Author information

Authors and Affiliations

  1. Department of Mechanical Engineering, Brigham Young University, Provo, UT 84602-4201, USA

    David T. Fullwood & Brent L. Adams

  2. Department of Materials Science and Engineering, Drexel University, LeBow 346, 3141 Chestnut Street, Philadelphia, PA 19104, USA

    Surya R. Kalidindi

Authors
  1. David T. Fullwood
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  2. Surya R. Kalidindi
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  3. Brent L. Adams
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Corresponding author

Correspondence to David T. Fullwood .

Editor information

Editors and Affiliations

  1. Physical Sciences Directorate, Lawrence Livermore National Laboratory, E. Ave. 7000, Livermore, 94550, U.S.A.

    Adam J. Schwartz

  2. Chemistry, Materials, Earth, & Life , Lawrence Livermore National Laboratory, East Ave. 7000, Livermore, 94550, U.S.A.

    Mukul Kumar

  3. Dept. Mechanical Engineering, Brigham Young University, Provo, 84602, U.S.A.

    Brent L. Adams

  4. School of Mechanical &, Washington State University, Pullman, 99164-2920, U.S.A.

    David P. Field

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Fullwood, D.T., Kalidindi, S.R., Adams, B.L. (2009). Second-Order Microstructure Sensitive Design Using 2-Point Spatial Correlations. In: Schwartz, A., Kumar, M., Adams, B., Field, D. (eds) Electron Backscatter Diffraction in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-88136-2_13

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