Abstract
If we are studying the structure of a material, when all is said and done, all we have to show for learning how to operate our expensive TEM, the many hours spent in specimen preparation, etc., is an image or a DP. These images and DPs, which are just different distributions of electron intensity, have first to be viewed in some manner. After viewing, we have to decide if we want to save the results for future reference, perhaps so we can print out the data for a presentation, technical report, or scientific publication. Since, as we noted in the opening chapter, our eyes are not sensitive to electrons, we have to find ways to translate the electron-intensity distributions generated by the specimen into visible-light distributions, which we can see. This chapter will explain how we ‘see’ electrons.
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References
The general references for SEM are the standard book by Goldstein et al. (3rd Ed.) and Reimer’s SEM text. The other references here are interesting (often challenging) reading.
Chapman, JN, Craven, AJ and Scott, CP 1989 Electron Detection in the Analytical Electron Microscope Ultramicroscopy 28 108–117.
Howell, SB 2006 Handbook of CCD Astronomy 2nd Ed. Cambridge University Press NY.
Knoll, GF 2000 Radiation Detection and Measurement 3rd Ed. John Wiley & Sons NY.
Pierret, RF 1996 Semiconductor Device Fundamentals Addison-Wesley Boston MA
Reimer, L 1985 Scanning Electron Microscopy Springer Verlag New York.
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Williams, D.B., Carter, C.B. (2009). How to ‘See’ Electrons. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-76501-3_7
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DOI: https://doi.org/10.1007/978-0-387-76501-3_7
Publisher Name: Springer, Boston, MA
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