Skip to main content

Abstract

A reliable source of electrons to ‘illuminate’ the specimen is one of themost important parts of a TEM. Fortunately, electron sources are plentiful, but to get the best images and other signals out of our expensive microscope, we need to use the best available source. There are stringent requirements to produce the beam of electrons with the necessary properties and these are best met by only two types of source: thermionic and field-emission sources (or ‘guns’ as they are often called). Thermionic sources are (now rarely) tungsten filaments or (now commonly) lanthanum hexaboride (LaB6) crystals, and field emitters are fine tungsten needles. In this chapter we’ll first explain briefly the physics of the different electron-emission processes because then you’ll understand why we operate the sources in certain ways.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 99.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 129.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 129.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Sources

  • Broers, AN 1974 in Recent Advances in Scanning Electron Microscopy with Lanthanum Hexaboride Cathodes SEM 1974 9–18, Ed. O Johari IITRI Chicago IL.

    Google Scholar 

  • de Jonge, N and van Druten, NJ 2003 Field Emission from Individual Multiwalled Carbon Nanotubes Prepared in an Electron Microscope Ultramicroscopy 95 85–91. Demonstrated a brightness in excess of 1014A/m2sr.

    Google Scholar 

  • Hawkes, PW 1978 Coherence in Electron Optics Adv. Opt. Electr. Microsc. 7 101–184.

    Google Scholar 

  • Orloff, J 1989 Survey of Electron Sources for High-Resolution Microscopy Ultramicroscopy 58 88–97.

    Google Scholar 

  • Veneklasen, LH 1972 Some General Considerations Concerning the Optics of the Field Emission Illumination System Optik 36 410–433.

    Google Scholar 

The Probe

  • Michael, JR and Williams, DB 1987 A Consistent Definition of Probe Size and Spatial Resolution in the Analytical Electron Microscope J. Microsc. 147 289–303. Details on how to measure the diameter of the probe.

    Google Scholar 

  • Mook, HW and Kruit, P 1999 On the Monochromatisation of High Brightness Electron Sources for Electron Microscopy Ultramicroscopy 78 43–51. Application to EFTEM.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to David B. Williams .

Rights and permissions

Reprints and permissions

Copyright information

© 2009 Springer Science+Business Media, LLC

About this chapter

Cite this chapter

Williams, D.B., Carter, C.B. (2009). Electron Sources. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-76501-3_5

Download citation

Publish with us

Policies and ethics