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Fine Structure and Finer Details

  • David B. Williams
  • C. Barry Carter

Abstract

In the previous chapter, we described elemental analysis using ionization edges, but there is much more than just elemental information in the ionization edges and this distinguishes EELS from XEDS. There are detailed intensity variations in the core-loss spectra called energy-loss near-edge structure (ELNES) and extended energy-loss fine structure (EXELFS). From this fine structure, which we can resolve because of the high-energy resolution inherent in EELS, we can obtain data on how the ionized atom is bonded, the coordination of that specific atom, and its density of states. As always, we can use any intensity changes to create filtered images which show the distribution of, e.g., regions of different bonding states. Furthermore, we can probe the distribution of other atoms around the ionized atom (i.e., determine the radial-distribution function (RDF) which is very useful for the study of amorphous materials) and we can study momentum-resolved EELS, observe the anisotropy of chemical bonds, combine EELS with tomography, inter alia.

Keywords

Bulk Metallic Glass Core Hole Augmented Plane Wave Ionization Edge Multiple Scattering Method 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Books And Reviews

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Calculations And Technique

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Applications

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Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  1. 1.The University of Alabama in HuntsvilleHuntsvilleUSA
  2. 2.University of ConnecticutStorrsUSA

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