Qualitative X-ray Analysis and Imaging
It is a waste of time to proceed with quantitative analysis of your XEDS spectrum or image without first carrying out qualitative analysis. Qualitative analysis requires that every peak in the spectrum be identified unambiguously, with statistical certainty, otherwise it should be ignored for both subsequent quantitative analysis and imaging. We emphasize this point because of the many opportunities for the misidentification of small peaks in the spectrum. In this chapter, we’ll deal initially with acquisition and identification of the elemental information in spectra and images. First, we will show you how to choose the best operating conditions for your particular AEM and XEDS system. Then we’ll explain the best way to obtain a spectrum for qualitative analysis. You have to acquire a spectrum with sufficient X-ray counts to allow you to draw the right conclusions with a given degree of confidence. There are a few simple rules to follow which allow you to do this.
KeywordsComputer Display Coffee Break Artifact Peak Companion Text Subsequent Quantitative Analysis
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- Goldstein, JI, Newbury, DE, Joy, DC, Lyman, CE, Echlin, P, Lifshin, E, Sawyer, L and Michael JR 2003 Scanning Electron Microscopy and X-ray Microanalysis 3rd Ed. p355 Kluwer Academic Press New York.Google Scholar
- Jansson, PA, Ed. 1997 Deconvolution of Image and Spectra Academic Press San Diego.Google Scholar
- Liebhafsky, HA, Pfeiffer, HG, Winslow, EH and Zemany, PD 1972 X-rays, Electrons and Analytical Chemistry p349 John Wiley and Sons New York. Some statistics.Google Scholar
- Newbury, DE 2005 Misidentification of Major Constituents by Automatic Qualitative Energy Dispersive X-ray Microanalysis: A Problem that Threatens the Credibility of the Analytical Community Microsc. Microanal. 11 545–561. (See discussion by Burgess, S 2006 idem 12 281 and Newbury, DE idem 1, 282.) Discussion of errors produced using commercial software.Google Scholar
- Schamber, FH 1981 Curve Fitting Techniques and Their Application to the Analysis of Energy Dispersive Spectra in Energy Dispersive X-ray Spectrometry 193–231 Eds. KFJ Heinrich, DE Newbury, RL Myklebust and CE Fiori NBS Special Publication 604 US Department of Commerce/NBS Washington DC.Google Scholar
- Watanabe, M and Williams, DB 2003 Improvements to the Energy Resolution of an X-ray Energy Dispersive Spectrum by Deconvolution Using the Zero Strobe Peak Microscopy and Microanalysis Eds. D Piston, J Bruley, IM Anderson, P Kotula, G Solorzano, A Lockley and S McKernan 124–125.Google Scholar